Clean Area
An enclosed, environmentally
conditioned area where airborne contaminants are controlled. Clean areas
are classified by a number such as 100, 10,000, 100,000, etc., in accordance
with FED-STD-209, which describes the maximum number of particles, 0.5
microns in size and larger, permitted per cubic foot of air under certain
performance and operating requirements.
Contamination
Material that degrades
the intended function of an instrument or flight hardware. Contamination
is usually separated into two types, particles and non-volatile residue
(NVR).
Contamination
Control
Organized action
to control contamination levels.
Fiber
Particle with a
length-to-width ratio exceeding 10:1 and a minimum length of 100 µm.
Particle
Small quantity of
solid or liquid material with definable shape or mass.
Particle Size
Maximum linear dimension
or diameter of a particle.
Sensitive
Surface
Flight hardware
surface requiring a specific cleanliness level to meet minimum performance
requirements.
Gross Cleaning
A cleaning operation
performed to achieve a level of product cleanliness as part of good
workmanship and good housekeeping practice, for example the removal
of oils, grease, oxide films, etc. Gross cleaning does not usually require
verification beyond visual appearance as observed without optical aids
other than normal corrected vision. This step precedes precision cleaning.
Precision
Cleaning
Cleaning of hardware
surfaces according to approved engineering methods and procedures to
meet specific criteria.
Solvent Flushing
Pressurized stream
of filtered solvent directed against a surface to dislodge and rinse
away contaminants.
Solvent Washes
Quantitative method
of verifying MIL-STD-1246C levels by measuring molecular contamination
in a solvent washed over a surface.
Surface Cleanliness
Level
An established level
of maximum allowable particulate and/or nonvolatile residue (NVR) contamination
ranging from visibly clean to specific MIL-STD-1246 levels.
Swab Sample
Qualitative method
of identifying contaminants by analyzing residue on a solvent soaked
swab that was wiped over a surface.
Nonvolatile
Residue (NVR)
Soluble material
remaining after evaporation of a volatile solvent, or determined by
special purpose analytical instruments, usually in milligrams per unit
area.
Tape Lifts
Qualitative method
of verifying MIL-STD-1246C particle cleanliness levels by measuring
particle contamination on a tape sample that has contacted a surface.
Vapor Degrease
Item to be cleaned
is exposed to heated solvent vapors that condense on the part and wash
away contaminants. (NOTE: Halogenated solvents used to vapor degrease
plastics are often outgassed or leached out later. Therefore, plastics
vapor degreased with halogenated solvents must be baked out.)
Visibly Clean
The achievement
of a visibly clean surface when viewed without optical aids (except
corrected vision) as measured by a specific method. This requirement
will be accompanied by a description of the method of verification (e.g.,
when viewed from an approximate distance using oblique white light of
an approximate intensity or under normal shop lighting, etc.).
VC
Cleanliness inspection
which specifies and incident light of 50 to 75 foot-candles. The surface
to be inspected shall be observed by the unaided (except for corrected
vision) eye at a distance of 2 to 5 feet.
VC-S
Cleanliness inspection
which specifies an incident light of 50-75 foot-candles. The surface
to be inspected shall be observed by the unaided eye (except for corrected
vision at a distance of 12-24 inches).
VC-HS
Cleanliness inspection
which specifies an incident light level of 100-125 foot-candles. The
surface to be inspected shall be observed by the unaided eye (except
for corrected vision) at a distance of 6 to 18 inches.
Visibly Clean
Plus Ultraviolet Visibly clean
(as defined above)
and inspected with the aid of an ultraviolet light (black light) of
3200 to 3800 Angstrom wavelength (320 to 380 nanometers). Note:
Any evidence of fluorescence shall be cause for recleaning. If recleaning
does not reduce the fluorescence, an investigation shall be made to
determine whether the fluorescing material is contamination or the basic
material. This level requires precision cleaning methods, but no particle
count.
©MSSL
Created by Alex Rousseau last
modified:
February 2, 2004 15:30