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The following table lists the functionality of the Read Out Electronics (ROE).
Functionality | Comments |
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Circuitry | . |
ADC resolution - 14 bit | The full well capacity of the CCD is about 100,000 electrons. To ensure that as much of the dynamic range of the CCD can be sampled a 14 bit ADC will be used. |
Time resolution - 2us per pixel | A readout rate of 2us per pixel will be adopted. |
CCD flush/dump unwanted rows | . |
Read out from left/right amplifier or both simultaneously | . |
Programmable bias voltages to minimize potential radiation induced changes | Vrd, Vod and Vss. |
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Imaging modes | . |
One region of interest can be defined | Window height and width must be the same on both CCDs. |
Binning | Available in both horizontal (spectral) and vertical (spatial) directions. Maximum binning range no more than 5x5. The slot facility on EIS minimizes the need for binning. |
Integration time controlled by ICU | There is a default mode of operation clocking out every 10 seconds to allow images to be taken even if the command link from the camera to the ICU is lost. |
Overclocking | There are 50 "lead in" pixels before each amplifier which can be read in a diagnostic mode. |
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Other Features | . |
Test ports will be available to test the Read Out Electronics without the need for ICU control. | . |
A Stim pattern will be available for ground testing. | . |
CCD
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This page was prepared by Chris McFee