Solar B - EIS

MULLARD SPACE SCIENCE LABORATORY
UNIVERSITY COLLEGE LONDON

Author: A Dibbens


SOLAR B - EIS RISK ASSESSMENT

Document Number: MSSL/SLB-EIS/AD005.02 04 July 2000

Distribution:

NRL
G Doschek


C Korendyke


S Myers


C Brown


K Dere


J Mariska




NAOJ
H Hara


T Watanabe




RAL
J Lang


B Kent


D Pike

BU
C Castelli


S Mahmoud

Mullard Space Science Laboratory
J L Culhane


A Smith


A James


L Harra


A McCalden
.

C McFee


R Chaudery


P Thomas


R Card


W Oliver


P Coker


R Gowen


K Al Janabi


M Whillock

SLB-EIS Project Office
A Dibbens
Orig

Author:

Date:





Authorised By

Date:





Distributed:

Date:



CHANGE RECORD



ISSUE
DATE
PAGES CHANGED
COMMENTS
01
9 June 2000
All New
Document re-issued in new numbering system. A major review of risks has been conducted in preparation for the EIS UK PDR
02
04 July 2000
3,4,5,6,7
Minor updates to paras 2 & 3. Par 4.1, EM changed to PM. Minor editorial changes to par 4.2. Par 5.1. addition of OE6.






























CONTENTS


1. SCOPE

2. APPLICABLE DOCUMENTS

3. DISCUSSION

4. PROGRAMMATIC RISK
4.1 System Level
4.2 Sub-system Level

5. OPERATIONAL RISK
5.1 System Level
5.2 Sub-system Level


1. SCOPE
This document constitutes the central element of the Solar-B EIS Risk Management Process. Here programmatic (i.e. risks to the delivery for flight of the EIS instrument within the schedule and budget constraints) and operational risks (i.e. risks to the quality and in-flight performance of the delivered instrument) are covered.

Risks are characterised in terms of their nature, likelihood, origin and ownership.

2. APPLICABLE DOCUMENTS
MSSL/SLB-EIS/SP007 EIS Science Requirements
MSSL/SLB-EIS/SP011 EIS System Definition
EIS-sys-eng-wbs EIS Work Break-down Structure
MSSL/SLB-EIS/AD004 Management Plan


3. DISCUSSION
This document contains a risk analysis for the Solar-B EUV Imaging Spectrometer (EIS) at system and sub-system level. Its purpose is to record the sources of risk and their degree for EIS and its subsystems, and the means to reduce them to acceptable levels. Operational and Programmatic risks are considered.


The probability of risks is described in a qualitative way using the following Scheme:
Term
Notation
Impossible
0
Very unlikely
1
Unlikely
2
Moderately Unlikely
4
Moderately Probable
6
Probable
8
Very Probable
9
Certain
10
Unknown
99

Risks are numbered for reference, according to type.
Each of the above risk types are described in separate section of this document.
The risk Category is the WBS code of the origin of the risk. 1000 = EIS instrument, 0000 = Solar-B mission.
Ownership indicates the institute that will be responsible for management of the risk. Within any Institute it is required that an individual take ownership of the risk.


4. PROGRAMMATIC RISK

4.1 System level (PE)

Sources of programmatic risk to the project as a whole are considered first.
Category
Element
Risk #
Prob
Owner
Event
Effect
Management
Notes
0000
Solar-B
PE3
1
ISAS
Launch Delay
Extra costs
Revise schedule
Has occurred once. Considered unlikely to occur again.
1000
EIS
PE4



PE4.1
PE4.2
PE4.3
PE4.4
PE4.5
PE4.6
2-4



4
4
2
4
4
2
MSSL



MSSL
MSSL
MSSL
MSSL
MSSL
MSSL
Incompatibility of sub-system interfaces at pre delivery integration

Mechanical interfaces
Thermal interfaces
Optical interfaces
Electrical interfaces
Cleanliness interfaces
PA interfaces

Failure to integrate hardware or software. Delay and/or additional costs of re-work

Rigorous attention to interface management procedures. Regular system design team meetings. Early integration checks, walkthroughs, configuration management. Allow schedule margin.


1000
EIS
PE6







PE6.1
PE6.2
PE6.3
2







2
2
2
MSSL







BU
MSSL
MSSL
System failure during environmental testing






MTM/TTM
PM
FM
Delay in delivery whilst reworks and retests occur






Design margins and derating of components. AIV schedule to include contingency for such events. Items which are both critical and particularly susceptible to have spares available - within budgetary constraints.

Each subsystem item should have been qualified to appropriate levels by analogy, analysis or test prior to system test. Lessons learned during EM and STM environmental tests should allow us to identify the susceptible items.
1000
EIS
PE7




PE7.1
PE7.2
PE7.3
2-4




3
2
2
MSSL




BU
MSSL
MSSL
Incompatibility with spacecraft discovered during integration



MTM/TTM
PM
FM
Delays to entire mission. Increased costs of support of rework in Japan. Possibility that instrument performance be compromised.
Close co-operation with the spacecraft design teams. Identification and control of comprehensive interface specification.
This would arise from inadequacy of interface management between the EIS and spacecraft teams. There is a vital need for prompt and reliable exchange of accurate interface information with the spacecraft teams.
1000
EIS
PE8





PE8.1
PE8.2
PE8.3
4





4
4
4
MSSL





BU
MSSL
MSSL
Late delivery of instrument





MTM/TTM
PM
FM
Schedule impact on spacecraft programme
Establish and agree realistic delivery schedule
Establish and agree realistic requirements for each model
Rigorously control internal schedules


4.2 Sub-system level (PS)
Programmatic risks are now considered for major WBS items in the Hardware (WBS Code 1000) and AIV (3000) branches.
Category
Element
Risk #
Prob
Owner
Event
Effect
Management
Notes
1100
Structure
PS1
4
BU
Composite material shows excessive out-gassing
Contamination of optical components/CCDs
Select and evaluate materials. Plan out-gassing paths. Investigate with Contamination Model.

1300
Optics
PS2
99
NRL
Multilayer coating fails to provide adequate reflectivity or other property
Instrument throughput threatened.
Seek to fully understand the coating technology and the sources of variation of performance. Consider possibility of re-coating or provision of uncoated spares. Allow contingency for this. Consider alternative coating technologies.
This is mainly an issue with the so-called EIS-400 wavelength range coating, range 6 in EIS Science Notes (EIS-sci-notes), operating near 400 Å, which is baselined to use the relatively unknown Si/Sc multilayer pair. This risk also pertains to the ageing properties of coatings.
1300
Optics
PS3
2
NRL
Optic inadequately figured or polished
Poor focusing properties leading to loss of spatial and spectral resolution. Possible need for re-work.
Form an error budget for each optical surface, allowing the system PSF to be estimated. Measure samples to validate the error budget. Unit level test.
1300
Optics
PS4
99
NRL
Grating manufacturing faults
Loss of throughput.
Error budget, with quantified error sources, is required. Test of grating performance prior to multilayer coating.
All comments also apply as per PS2
1300
Optics
PS5
2
NRL
Proposed mechanism fails to meet spacecraft disturbance torque requirement
Other Solar-B instrumentation performance degraded.
Seek alternative mechanisms (mass penalties are likely), or propose spacecraft-level observation (i.e. mechanism) control protocol. Seek to avoid this risk in the early stages of the programme.
This is an important requirement for the successful operation of Solar-B SOT.
1600
Shutter
PS6
2
NRL
Motor unavailable
Shutter redesign, possible life test program (costs & schedule affected)
Explore likelihood of this, if necessary study replacement options.
The shutter design currently baselined, which has substantial space flight heritage, uses a specific (brushless) motor.
1400
Filters
PS7
5
NRL
Accidental breakage of filter
Possible debris in the instrument. Excessive light at CCDs. Excessive heat input.
non-flight protective covers, spares, design for exchange procedures (including cleaning)
´
1500
Slit
PS8
2
NRL
Slit exchange mechanism fails disturbance torque criteria
Other Solar-B instrumentation performance degraded.
Choose a single slit (or slit/slot) that gives best all-round performance, or seek alternative mechanisms. Merge operational sequences with other instruments.
See also the comments on PS2 – PS6
1710
CCD
PS9
6
MSSL
Loss of device due to (e.g.) static discharge
Replacement needed
Provide for (in contract) adequate test-grade devices during development programme and spares of flight devices. Design for late replacement of CCD. Consider static discharge protection procedures.
Simulators may be used for many test purposes.
1730
ROE
PS10
2
MSSL
High power consumption of readout electronics
Exceed instrument power budget
Carefully engineer for low power. Demonstrate at breadboard level
Possible tradeoff between readout rate and power consumption
1922
Radiator
PS11
5
MSSL
Radiator cannot provide necessary CCD cooling
Radiation damage (see Operational Risks - 1740 CCD) causes unacceptable performance degradation
Seek to minimise CCD radiation damage by alternative clocking regimes and/or shielding. Consider radiator designs that avoid viewing the Earth.
The orbit and spacecraft configuration mean that Earthshine becomes a problem for efficient thermal design with a simple radiator.
3410
Electronic Ground Support Equipment (EGSE)
PS12
1
MSSL
EGSE software not ready for AIV programme caused by lack of continuity of Norwegian effort
AIV cannot be accomplished
Design for interoperability with sub-system EGSE. Specify early delivery of an EGSE version which is capable of supporting a subset of functions for test use.
3420
Mechanical Ground Support Equipment (MGSE)
PS13
1
BU
Gas purge equipment - contaminates instrument
Dismantle, clean and reassemble structure and optics (TBD)
Obtain certificates of purity or equip with in-line gas analysers. Verify purity of equipment.
A purged structure is considered to be considerably easier to produce than a vacuum vessel (especially given the Solar-B mass constraints).
3800
Calibration
PS14
6
RAL + MSSL
Insufficient time to complete calibration
Poor knowledge of in-flight performance - value of science data reduced
Allow schedule contingency at this stage of the programme. Rehearse calibration procedures prior to arrival of FM instrument.
1100
Structure
PS15
4
BU
Non-delivery of suitable structure
Probable termination of project.
BU to commission expert help in design and manufacture of composites.
BU may need to solicit additional funding.
1710
CCD
PS16
4
MSSL
CCD quality poor
Degraded science performance
Take out option to purchase further devices, as necessary.
Contract for CCD foresees this possibility

Sub-system

Structure
Camera
ICU
QCM
Optics/Mech’
MHC
Software
GSE
PS17

PS17.1
PS17.2
PS17.3
PS17.4
PS17.5
PS17.6
PS17.7
PS17.8
2-6

6
4
4
2
3
4
4
3
See below
BU
MSSL
MSSL
RAL
NRL
MSSL
MSSL
Var
Late delivery of subsystem for integration
Schedule delay
Establish realistic schedule and then rigorously enforce.


MHC
PS18
4
MSSL
NRL software not transferable to flight standard
Schedule delay through need for extra work
Close Liaison between NRL and MSSL
Issue raised at NASA PDR

5. OPERATIONAL RISK

5.1 System Level (OE)

Category
Element
Risk #
Prob
Owner
Event
Effect
Management
Notes
1000
EIS
OE2
4
RAL
Contamination - optics or detector
Progressive loss of sensitivity and ultimate loss of instrument, uncertainty in intensity calibration
Contamination control plan, Front door closure, Purging, QCM, CCD Heater, venting paths
1000
EIS
OE3
99
MSSL
Electronic Component failure
Possible loss of instrument or reduced scientific return
Appropriate component quality, fault tolerant design, redundant interfaces
Failure mode analysis to unit, board or component level will be carried out as the designs mature.
1000
EIS
OE4
2
MSSL
“bad command”
Ranges from severe (damage to hardware?) to nearly benign (although an observation could be missed).
Identify hazardous states of the instrument. Do not allow these to be reached without operator confirmation. Allow detection of such conditions (e.g. by recording all tele-commands).
A bit error in a command sequence should be detected by checksum mechanisms incorporated into the data link protocols. This risk concerns the possibility that the operator sends a valid command that nevertheless is not the intended or appropriate one.
1000
EIS
OE5
4
MSSL
On-board software error
Control program halt, output data error, & effects in "bad command"
Allow detection and reboot, periodically compare memory checksum with nominal value
probable cause: SEU
1000
EIS
OE6
99
ISAS
Disturbance from mechanism of another instrument
Degraded science data
Need to manage observing sequence. Control disturbing source budget



5.2 Sub-system level (OS)

Risks associated with individual WBS elements are considered.
Category
Element
Risk #
Prob
Owner
Event
Effect
Management
Notes
1200
Door
OS1
2
BU
Clamshell Door(s) mechanism failure
Fail closed - Loss of instrument. Fail open - possible contamination during thruster firings.
Life-test programme Redundant heaters in actuators

1300
Optics
OS2
99
NRL
Ageing of multilayer coatings
Instrument throughput reduced.
Perform life tests on coatings whose ageing properties are unknown.

1300
Optics
OS3
2
NRL
Scanning mechanism failure
Loss of scanning and alignment compensation
Life test programme. No possibility to move outside of functional position. Monitoring and management of movements during mission.
1300
Optics
OS4
2
NRL
Grating focus mechanism failure
(fail in focused position) Flat-fielding of detector no longer possible. (fail in de-focused position) loss of science
Life test programme. Redundant actuators.
1600
Shutter
OS5
1
NRL
Shutter failure
(fail closed) Loss of instrument (fail open) image smearing
Select proven technology. Life test

1400
Filters
OS6
1
NRL
meteoroid strike on front filter
possible debris in the instrument. White light ingress to detector - worsens SNR. Heat input to instrument - thermal stresses and consequent misalignment
Recess filter in exterior baffle. Use segmented filter design to limit area od breakage.
1500
Slit
OS7
99
NRL
Slit exchange mechanism fails
Fail in a nominal slit position - loss of rapid imaging facility Fails in viewfinder position - loss of spectroscopy in intermediate position - some spectroscopy retained
Select proven technology. Life test.
(assuming mechanism with one or more spectroscopy slit and a wide viewfinder slit)
1710
CCD
OS8
4
MSSL
Radiation Damage to CCD
1. Dark current distribution 2. CTE change 3. clock bias drift 4. no longer operates (output FET latch-up)
Appropriate shielding to ensure life commensurate with mission Monitor dark current distribution periodically. Provide means to adjust operating temperature and clocking rate. Provide ability to adjust the clock bias levels.
1A00
ICU/MHU
OS9
4
MSSL
Radiation Damage to electrical component
Data degradation
Latch-up – loss of function
Component selection to be rad hard to required level. Local shielding as required.