The EPIC sensitivity limits depend on the angular structure and the spectral characteristics of the source that is observed. The numbers for an unresolved point source with a power law emission spectrum are listed in Table 5.
Int. time [ks] | 0.1-2.4 keV | 0.4-4.5 keV | 2-10 keV | 0.1-15 keV |
10 | 17 | 20 | 64 | 33 |
20 | 9 | 11 | 33 | 18 |
30 | 7 | 8 | 20 | 13 |
60 | 4 | 5 | 13 | 8 |
100 | 2.7 | 3.5 | 8.7 | 5.7 |
Both internal (particle-induced) and external (celestial X-ray) background was included in the calculations, as described in § 3.3.7. A detect cell the size of the FWHM of the XMM PSF were used.
Cont. flux2 | 10 ks | 100 ks |
10-3 | 103 | 32.2 |
10-4 | 33.6 | 10.3 |
10-5 | 11.8 | 3.36 |
10-6 | 5.07 | 1.18 |
10-7 | 3.35 | 0.51 |
10-8 | 3.08 | 0.34 |
10-9 | 3.05 | 0.31 |
Cont. flux2 | 10 ks | 100 ks |
10-3 | 82.3 | 25.7 |
10-4 | 27.1 | 8.23 |
10-5 | 9.79 | 2.71 |
10-6 | 4.56 | 0.98 |
10-7 | 3.32 | 0.46 |
10-8 | 3.15 | 0.33 |
10-9 | 3.13 | 0.31 |
The sensitivity limits for two selected emission lines are tabulated in Tables 6 and 7. Here the background was treated as if it were part of the underlying continuum flux. In Tables 5-7 and Figs. 24-26 the sensitivity limits of only the EPIC pn camera are provided. Using the effective area curves from above, one can estimate that the numbers should be multiplied by a factor of 0.75 to obtain the approximate sensitivity of all EPIC cameras combined.
Fig. 24 displays the minimum detectable source flux for a point source with an = 0.7 power law spectrum, Fig. 25 that of an = 3.0 (``soft excess'') source. Fig. 26 shows the minimum detectable source flux for 30'' extended sources with a kT = 0.3 keV Mewe-Kaastra-Liedahl (in the following ``Mekal'') thermal plasma.